Enhancing Material Features Using Dynamic Backward Attention on Cross-Resolution Patches

Published in 33rd British Machine Vision Conference 2022, 2022

Recommended citation: Yuwen Heng, Yihong Wu, Srinandan Dasmahapatra, and Hansung Kim. Enhancing material features using dynamic backward attention on cross-resolution patches. In 33rd British Machine Vision Conference 2022, BMVC 2022, London, UK, November 21-24, 2022. BMVA Press, 2022a https://bmvc2022.mpi-inf.mpg.de/0004.pdf